Author Tegenkamp, Christoph
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2011 | Journal Article
Electronic and chemical properties of the c-Si/Al2O3 interface
Werner, F. A.; Veith, B.; Zielke, D.; Kuehnemund, L.; Tegenkamp, C.; Seibt, M. & Brendel, R. et al. (2011)
Journal of Applied Physics, 109(11) art. 113701. DOI: https://doi.org/10.1063/1.3587227
Details DOI WoS
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2020 | Journal Article |
Substrate induced nanoscale resistance variation in epitaxial graphene
Sinterhauf, A.; Traeger, G. A.; Momeni Pakdehi, D.; Schädlich, P.; Willke, P. ; Speck, F. & Seyller, T. et al. (2020)
Nature Communications, 11(1). DOI: https://doi.org/10.1038/s41467-019-14192-0
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