Author Gemme, C.
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2020 | Journal Article
Measurements of Single Event Upset in ATLAS IBL
Balbi, G.; Barbero, M.; Beccherle, R.; Bindi, M.; Breugnon, P.; Butti, P. & Cinca, D. et al. (2020)
Journal of Instrumentation, 15(06) pp. P06023-P06023. DOI: https://doi.org/10.1088/1748-0221/15/06/P06023
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2023 | Journal Article
Test of ITk 3D sensor pre-production modules with ITkPixV1.1 chip
Calderini, G.; Crescioli, F.; Dalla Betta, G.-F.; Gariano, G.; Gemme, C.; Guescini, F. & Hadzic, S. et al. (2023)
Journal of Instrumentation, 18(01) art. C01010. DOI: https://doi.org/10.1088/1748-0221/18/01/C01010
Details DOI