Author Gemme, C.

1 to 2 of 2 Items
  • 2020 | Journal Article
    ​ ​Measurements of Single Event Upset in ATLAS IBL​
    Balbi, G.; Barbero, M.; Beccherle, R.; Bindi, M.; Breugnon, P.; Butti, P. & Cinca, D. et al.​ (2020) 
    Journal of Instrumentation, 15(06) pp. P06023​-P06023​.​ DOI: https://doi.org/10.1088/1748-0221/15/06/P06023 
    ​Details  DOI 
  • 2023 | Journal Article
    ​ ​Test of ITk 3D sensor pre-production modules with ITkPixV1.1 chip​
    Calderini, G.; Crescioli, F.; Dalla Betta, G.-F.; Gariano, G.; Gemme, C.; Guescini, F. & Hadzic, S. et al.​ (2023) 
    Journal of Instrumentation, 18(01) art. C01010​.​ DOI: https://doi.org/10.1088/1748-0221/18/01/C01010 
    ​Details  DOI 

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