Author Damaschke, Bernd
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2000 | Journal Article
Measurement of nanohardness and nanoelasticity of thin gold films with scanning force microscope
Kracke, B. & Damaschke, B. (2000)
Applied Physics Letters, 77(3) art. PII [S0003-6951(00)05429-2]. DOI: https://doi.org/10.1063/1.126976
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2002 | Journal Article
Intrinsic inhomogeneities in manganite thin films investigated with scanning tunneling spectroscopy
Becker, T.; Streng, C.; Luo, Y.; Moshnyaga, V. T.; Damaschke, B.; Shannon, N. & Samwer, K. H. (2002)
Physical Review Letters, 89(23) art. 237203. DOI: https://doi.org/10.1103/PhysRevLett.89.237203
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2003 | Journal Article
Low-field transverse magnetovoltage in manganite films
Moshnyaga, V. T.; Damaschke, B.; Tidecks, R. & Samwer, K. H. (2003)
Journal of Applied Physics, 93(10) pp. 6354-6360. DOI: https://doi.org/10.1063/1.1567036
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2003 | Journal Article
Structural phase transition at the percolation threshold in epitaxial (La0.7Ca0.3MnO3)(1-X):(MgO)(X) nanocomposite films
Moshnyaga, V. T.; Damaschke, B.; Shapoval, O.; Belenchuk, A.; Faupel, J.; Lebedev, O. I. & Verbeeck, J. et al. (2003)
Nature Materials, 2(4) pp. 247-252. DOI: https://doi.org/10.1038/nmat859
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2004 | Journal Article
Suppression of interface-induced electronic phase separation in all-manganite multilayers by preservation of the Mn-O chain network
Giesen, F.; Damaschke, B.; Moshnyaga, V. T.; Samwer, K. H. & Mueller, G. A. (2004)
PHYSICAL REVIEW B, 69(1) art. 014421. DOI: https://doi.org/10.1103/PhysRevB.69.014421
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2007 | Journal Article
Direct imaging of lattice-strain-induced stripe phases in an optimally doped manganite film
Sudheendra, L.; Moshnyaga, V. T.; Mishina, E. D.; Damaschke, B.; Rasing, T. & Samwer, K. H. (2007)
PHYSICAL REVIEW B, 75(17) art. 172407. DOI: https://doi.org/10.1103/PhysRevB.75.172407
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2007 | Journal Article
Nanostructure of chemically phase separated La-Ce-Mn-O thin films
Stingl, C.; Moshnyaga, V. T.; Luo, Y.; Damaschke, B.; Samwer, K. H. & Seibt, M. (2007)
Applied Physics Letters, 91(13) art. 132508. DOI: https://doi.org/10.1063/1.2790494
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2008 | Journal Article
Thermophysical properties of Si, Ge, and Si-Ge alloy melts measured under microgravity
Chathoth, S. M.; Damaschke, B.; Samwer, K. H. & Schneider, S. (2008)
Applied Physics Letters, 93(7) art. 071902. DOI: https://doi.org/10.1063/1.2973047
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